Last edited by Sagor
Wednesday, April 29, 2020 | History

3 edition of Speckle metrology found in the catalog.

Speckle metrology

  • 116 Want to read
  • 19 Currently reading

Published by Marcel Dekker in New York .
Written in English

    Subjects:
  • Nondestructive testing.,
  • Speckle metrology.

  • Edition Notes

    Includes bibliographical references and index.

    Statementedited by Rajpal S. Sirohi.
    SeriesOptical engineering ;, 38, Optical engineering (Marcel Dekker, Inc.) ;, v. 38.
    ContributionsSirohi, R. S.
    Classifications
    LC ClassificationsTA417.2 .S66 1993
    The Physical Object
    Paginationxiii, 551 p. :
    Number of Pages551
    ID Numbers
    Open LibraryOL1393568M
    ISBN 100824789326
    LC Control Number93000734

    Writing this preface in July, in anticipation of the conference, we have tried to envisage how this book will benefit the quality of discourse between authors and attendees. "Interferometry in Speckle Light: Theory and Applications" results from a bottom-up approach and is original in several ways. metrology for full-field NDE (Non destructive Evaluation).The speckle techniques can be classified into three broad categories: speckle photography, speckle interferometry and speckle shear interferometry. Speckle photography [2] includes the methods where positional changes of the speckle are Size: 1MB.


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Speckle metrology Download PDF EPUB FB2

Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications.

The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also covered in the book include methodology, system geometries, data.

1st Edition Published on by CRC Press This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring t Speckle Metrology - 1st Edition - Sirohi - Brian J.

Thompson - Rout. This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the Cited by:   Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications.

The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also covered in the book include methodology, system Book Edition: 1.

Speckle Metrology - CRC Press Book This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysi.

Covers speckle metrology and its value as a measuring technique in industry. This book also surveys the origin of speckle displacement and decorrelation, presents procedures for deformation analysis and shape measurement of rough objects, and explains particle image velocimetry (PIV).

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the.

About this book. Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way.

Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way.

Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications. The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle.

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry Price: $ Abstract.

The field of speckle metrology has seen a surge in development in the past 10 years owing to advancements in digital cameras and computing power. For instance, a variety of digital speckle correlation (DSC) processes can now be performed in almost real time and therefore speckle techniques has found applications in nondestructive testing.

Several multiauthor books have been published beyond the first one published in (Speckle Metrology, edited by R. Erf) - including Digital Speckle Pattern Interferometry and Related Techniques, edited by P.K. Rastogi, and Advances in Speckle Metrology and Related Techniques, edited by G.

Kaufmann - show new branches in speckle metrology, new proposed schemes and improvements in. Use of holographic optical elements in speckle metrology C.

Shakher, G. Venkata Rao (Applied Optics ) Measurement of time-varying displacement fields by multiple-exposure speckle photography J. Huntley, J. Field (Applied Optics ). J. Butters, J. Leendertz, Speckle pattern and holographic techniques in engineering metrology.

Opt. Laser Technol. 3, 26–30 () CrossRef ADS Google Scholar. Speckle metrology includes various optical techniques that are based on the speckle fields generated by scattering from a rough surface or by transmission through a rough diffuser.

These techniques have proven to be very useful in testing different materials in a non-destructive : Hardcover. which is used with speckle metrology in this thesis can be found in the book “Light in Flight or The Holodiagram” by Nils Abramson [5].

Some important scientific papers about speckle metrology techniques are found in the SPIE Milestones series: Selected papers on Speckle metrology [6]. Some others are listed in the reference part. This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology:.

The range of four methods of speckle metrology as applied to in-plane displacement analysis is studied, in terms of the number of fringes that can be generated.

Both quality and quantity of fringes are treated insofar as they affect the range and precision of the method. Some 20 variables are seen to influence the fringe range.

A number of these are analyzed by: Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser.

These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with.

Speckle-Metrologie Speckle-Metrology Electronic books: Additional Physical Format: Print version: Speckle metrology.

New York: Academic Press, (DLC) (OCoLC) Material Type: Document, Internet resource: Document Type: Internet Resource, Computer File: All Authors / Contributors: Robert K Erf.

from book Laser Measurement Technology (pp) Speckle Metrology. Chapter October Basic speckle metrology and autonomic computing resources are of course the most realistic uses of picotechnology.

The ability to examine and manipulate resources at this level is quite useful. Of course, it is not difficult to imagine the tangible advantages of this type of : Anil Akdogan. While speckle has been a nuisance in almost all of the applications we have discussed previously, in the field of metrology, speckle is put to good use.

Applications that use speckle for measurements of displacements arose in the late s and early s, often Author: Joseph W. Goodman. Speckle metrology: Authors: Erf, R. Affiliation: AA(United Technologies Research Center, East Hartford, Conn.) The book deals with the theoretical concepts and experimental methods of performing speckle-based measurements to provide stimuli for the scientific community and new techniques, applications, and refinements to the practicing.

Speckle Metrology by Sirohi buy online. ISBN:Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications. The book discusses both theoretical concepts and experimental methods in speckle-based measurements.

Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also covered in the book include methodology, system geometries, data reduction. Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field.

Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the.

Description: Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications. The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle.

Other aspects also covered in the book include methodology, system. Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser.

These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the. Optical Metrology.

Welcome,you are looking at books for reading, the Optical Metrology, you will able to read or download in Pdf or ePub books and notice some of author may have lock the live reading for some of ore it need a FREE signup process to obtain the book.

If it available for your country it will shown as book reader and user fully subscribe will benefit by having full. Some of the applications discussed include speckle in astronomy, speckle in the eye, speckle in projection displays, speckle in coherence tomography, speckle in lithography, speckle in waveguides (modal noise), speckle in optical radar detection, and speckle in metrology.

This book is aimed at graduate students and professionals working in a 5/5(3). Speckle metrology [20] has been verified and deployed to measure the surface roughness of bulk metallic glasses through a laser-scattering method with adaptive optics, and can be integrated into a.

Download Speckle study constitutes a multidisciplinary area with inherent complexities. In order to conquer challenges such as the variability of samples and sensitive measurements, researchers must develop a theoretical and statistical understanding of both biological and non-biological metrology using dynamic speckle laser.

Nowadays, it deserves a chapter in almost every book that is published on speckle techniques, holographic interferometry or optical metrology. Despite this, a monograph on DSPI has long been awaited, and here it is. Pramod Rastogi has edited this comprehensive review that covers most of the concepts, methods and techniques in the field of DSPI.

Forty years later he wrote the most comprehensive book on the subject—Speckle Phenomena in Optics: Theory and Applications (), which became an instant classic and is the definitive text book. Goodman, the master of his subject, now presents an excellent second edition of an already excellent book.”.

The book describes the basic principles of image correlation, light scattering, atomic force microscopy, moiré methods, grating interferometry, interference microscopy, laser Doppler vibrometry, digital holography, speckle metrology, and spectroscopic techniques, and also their major application for Microsystems testing.

Nowadays, it deserves a chapter in almost every book that is published on speckle techniques, holographic interferometry or optical metrology. Despite this, a monograph on DSPI has long been awaited, and here it is.

Pramod Rastogi has edited this comprehensive review that covers most of the concepts, methods and techniques in the field of by: Speckle Phenomena in Optics tells it all. It gives a detailed description of speckle, explains techniques for suppressing speckle, and it gives several applications of speckle in imaging and metrology.

Once again, Joseph W. Goodman has provided us with a clearly written technical book that will become a classic in its field.". SPECKLE METROLOGY Speckle metrology is an important and growing part of optical measuring techniques in experimental mechanics.

Speckle techniques use the random pattern of dark and bright spots (speckles) that are formed in space when a diffusely reflecting object is illuminated by coherent laser light (laser speckles).

The objective of the present paper is to review the various speckle techniques developed for structural deformation measurements. The techniques are grouped into two categories - speckle interferometry and speckle-shearing interferometry.

The former measures surface displacement while the latter determines the displacement derivatives. The various versions of these two categories are briefly Author: Hung, Y. Y.Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems.

Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around.Some of the applications discussed include speckle in astronomy, speckle in the eye, speckle in projection displays, speckle in coherence tomography, speckle in lithography, speckle in waveguides (modal noise), speckle in optical radar detection, and speckle in metrology.

This book is aimed at graduate students and professionals working in a.